Temperature-Modulated Ellipsometry: A New Probe for Glass Transition in Thin Supported Polymer Films
Author:
Affiliation:
1. Department of Chemical and Biological Engineering and Center for Nanotechnology, University of Wisconsin—Madison, Madison, Wisconsin 53706
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ma8011416
Reference13 articles.
1. Modulation calorimetry and related techniques
2. Lacey, A. A.; Price, D. M.; Reading, M.InModulated-Temperature Differential Scanning Calorimetry, Theoretical and Practical Applications in Polymer Characterisation. Series: Hot Topics in Thermal Analysis and Calorimetry;Reading, M.; Hourston, D. J., Eds.Springer:New York,2006; Vol.6, pp1−79.
3. Modulated-temperature thermomechanical analysis
4. Temperature modulated dielectric analysis (TMDA): a new experimental technique for the separation of temperature and reaction effects in dielectric cure monitoring signals
5. Vacuum ellipsometry as a method for probing glass transition in thin polymer films
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