Determination of Thermal Transition Depth Profiles in Polymer Semiconductor Films with Ellipsometry-Reference-Cited by-同舟云学术

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Determination of Thermal Transition Depth Profiles in Polymer Semiconductor Films with Ellipsometry

Published:2013-09-09 Issue:18 Volume:46 Page:7325-7331
ISSN:0024-9297
Container-title:Macromolecules
language:en
Short-container-title:Macromolecules

Author:

Müller Christian¹²³,Andersson L. Mattias²,Peña-Rodríguez Ovidio¹,Garriga Miquel¹,Inganäs Olle²,Campoy-Quiles Mariano¹

Affiliation:

1. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Esfera UAB, Bellaterra 08193, Spain

2. Biomolecular and Organic Electronics, Department of Physics, Chemistry & Biology, Linköping University, 58183 Linköping, Sweden

3. Department of Chemical and Biological Engineering/Polymer Technology, Chalmers University of Technology, 41296 Göteborg, Sweden

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ma400871u

Reference40 articles.

1. Ellipsometric study of the glass transition and thermal expansion coefficients of thin polymer films

2. Size-Dependent Depression of the Glass Transition Temperature in Polymer Films

3. Molecular weight dependence of reductions in the glass transition temperature of thin, freely standing polymer films

4. Influence of molecular weight and film thickness on the glass transition temperature and coefficient of thermal expansion of supported ultrathin polymer films

5. Character of the glass transition in thin supported polymer films

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