In Situ Electrical Characterization of Carbon Nanotubes in O<sub>2</sub> and N<sub>2</sub> Plasma to Explain their Field Emission Instability-Reference-Cited by-同舟云学术

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In Situ Electrical Characterization of Carbon Nanotubes in O₂ and N₂ Plasma to Explain their Field Emission Instability

Published:2024-06-29 Issue:13 Volume:7 Page:15648-15654
ISSN:2574-0970
Container-title:ACS Applied Nano Materials
language:en
Short-container-title:ACS Appl. Nano Mater.

Author:

Kuo Yen-Hung¹^ORCID,Fang Jen-Kuang²,Chen Jen-Chun²,Shih Pai-Sheng²,Chen Ping-Chun¹^ORCID,Yang Yung-Kai¹^ORCID,Tsai Hsin-Jung¹^ORCID,Hsu Wen-Kuang¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 30013, Taiwan

2. Corporate R&D Center, Advanced Semiconductor Engineering Inc., No. 26, Jing 3rd Road, Nanzih District, Kaohsiung 811641, Taiwan

Funder

Advanced Semiconductor Engineering, Inc.

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsanm.4c02655

Reference25 articles.

1. Nanotube field electron emission: principles, development, and applications

2. Chemistry of Carbon Nanotubes

3. Review on development of carbon nanotube field emission cathode for space propulsion systems

4. A Carbon Nanotube Field-Emission Electron Source

5. Field emission behavior of carbon nanotube field emitters after high temperature thermal annealing

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