Scanning Probe Microscopy-Reference-Cited by-同舟云学术

Scanning Probe Microscopy

Published:2002-05-11 Issue:12 Volume:74 Page:2851-2862
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Poggi Mark A.¹,Bottomley Lawrence A.¹,Lillehei Peter T.¹

Affiliation:

1. School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400, and Advanced Materials and Processing Branch, NASA Langley Research Center, Hampton, Virginia 23681-2199

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac025695w

Reference190 articles.

1. Microfabricated small metal cantilevers with silicon tip for atomic force microscopy

2. Megahertz silicon atomic force microscopy (AFM) cantilever and high-speed readout in AFM-based recording

3. Mechanical behavior of ultrathin microcantilever

4. FIB micromachined submicron thickness cantilevers for the study of thin film properties

5. Optical active gallium arsenide cantilever probes for combined scanning near-field optical microscopy and scanning force microscopy

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