In situ Raman Spectroscopy and Spectroscopic Ellipsometry Analysis of the Iron/Polypyrrole Interface-Reference-Cited by-同舟云学术

In situ Raman Spectroscopy and Spectroscopic Ellipsometry Analysis of the Iron/Polypyrrole Interface

Published:2007-09-08 Issue:39 Volume:111 Page:14400-14409
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Van Schaftinghen Thomas¹,Joiret Suzanne¹,Deslouis Claude¹,Terryn Herman¹

Affiliation:

1. Department of Metallurgy, Electrochemistry and Materials Science, Vrije Universiteit Brussel, Pleinlaan 2, 1050 Brussels, Belgium, and LISE “Laboratoire Interface et Systèmes Electrochimiques”, Université Pierre et Marie Curie, 4 place Jussieu, 75252 Paris Cedex 05, France

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp0734878

Reference64 articles.

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