Interfacial Defect Engineering Triggered by Single Atom Doping for Highly Efficient Electrocatalytic Nitrate Reduction to Ammonia

Author:

Wang Zhichao1,Liu Sisi2ORCID,Zhao Xinying2,Wang Mengfan2ORCID,Zhang Lifang3ORCID,Qian Tao3ORCID,Xiong Jie1ORCID,Yang Chengtao1,Yan Chenglin2ORCID

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, 610054 Chengdu, China

2. College of Energy, Key Laboratory of Core Technology of High Specific Energy Battery and Key Materials for Petroleum and Chemical Industry, Soochow University, 215006 Suzhou, China

3. School of Chemistry and Chemical Engineering, Nantong University, 226019 Nantong, China

Funder

China Postdoctoral Science Foundation

Government of Jiangsu Province

National Natural Science Foundation of China

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Biomedical Engineering,General Chemical Engineering

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