Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography-Reference-Cited by-同舟云学术

Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography

Published:2008-04-01 Issue:5 Volume:8 Page:1404-1409
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Rastelli Armando¹,Stoffel Mathieu¹,Malachias Angelo¹,Merdzhanova Tsvetelina¹,Katsaros Georgios¹,Kern Klaus¹,Metzger Till H.¹,Schmidt Oliver G.¹

Affiliation:

1. Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstrasse 20, D-01069 Dresden, Germany, Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-70569 Stuttgart, Germany, and European Synchrotron Radiation Facility, Boîte Postale 220, F-38043 Grenoble Cedex, France

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl080290y

Reference37 articles.

1. Thermodynamics of Coherently-Strained GexSi1-x Nanocrystals on Si(001): Alloy Composition and Island Formation

2. Evolution of Ge islands on Si(001) during annealing

3. Composition of self-assembled Ge/Si islands in single and multiple layers

4. Intermixing-promoted scaling of Ge/Si(100) island sizes

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