Author:
Mortier Ronald.,Vandecasteele Carlo.,Strijckmans Karel.,Hoste Julien.
Publisher
American Chemical Society (ACS)
Cited by
7 articles.
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1. Activation Analysis for Determination of Trace Elements;Tetsu-to-Hagane;2014
2. Study on boron depth profiles in boron-doped diamond films by broad resonance reaction 11B(p,α)8Be at Ep=660 keV;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-02
3. Determination of boron in titanium by deuteron activation analysis;Analytica Chimica Acta;1992-06
4. Analysis of boron by charged particle bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03
5. Analysis of Aluminum and Its Alloys;Tetsu-to-Hagane;1989