Accurate Height and Volume Measurements on Soft Samples with the Atomic Force Microscope-Reference-Cited by-同舟云学术

Accurate Height and Volume Measurements on Soft Samples with the Atomic Force Microscope

Published:2004-10-08 Issue:23 Volume:20 Page:10038-10045
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Jiao Yuekan¹,Schäffer Tilman E.¹

Affiliation:

1. Max Planck Institute for Biophysical Chemistry, Department of Molecular Biology, Am Fassberg 11, 37077 Göttingen, Germany, and Center for Nanotechnology (CeNTech) and Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Gievenbecker Weg 11, 48149 Münster, Germany

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la048650u

Reference59 articles.

1. Atomic Force Microscope

2. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

3. Tapping mode atomic force microscopy in liquids

4. Force microscopy imaging in liquids using ac techniques

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