Quantifying the Stress Relaxation Modulus of Polymer Thin Films via Thermal Wrinkling
Author:
Affiliation:
1. Polymers Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, United States
2. IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598, United States
Publisher
American Chemical Society (ACS)
Subject
General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/am100956q
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1. Polymer Gate Dielectric Surface Viscoelasticity Modulates Pentacene Transistor Performance
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