In Situ Raman Mapping of Si Island Electrodes and Stress Modeling as a Function of Lithiation and Size-Reference-Cited by-同舟云学术

In Situ Raman Mapping of Si Island Electrodes and Stress Modeling as a Function of Lithiation and Size

Published:2023-08-16 Issue:34 Volume:15 Page:40409-40418
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Wang Haotian¹^ORCID,Song Yueming²,Ferrari Victoria Castagna¹^ORCID,Kim Nam Soo³,Lee Sang Bok³^ORCID,Albertus Paul²^ORCID,Rubloff Gary¹,Stewart David Murdock¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering & Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, Maryland 20740, United States

2. Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, Maryland 20740, United States

3. Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20740, United States

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.3c06287

Reference50 articles.

1. Lithium insertion into silicon electrodes studied by cyclic voltammetry and operando neutron reflectometry

2. Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution

3. Failure mechanisms of single-crystal silicon electrodes in lithium-ion batteries

4. Cracking mechanisms in lithiated silicon thin film electrodes

5. Designing nanostructured Si anodes for high energy lithium ion batteries

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