Wafer-Scale Fabrication and Characterization of Thin-Film Transistors with Polythiophene-Sorted Semiconducting Carbon Nanotube Networks-Reference-Cited by-同舟云学术

Wafer-Scale Fabrication and Characterization of Thin-Film Transistors with Polythiophene-Sorted Semiconducting Carbon Nanotube Networks

Published:2011-12-21 Issue:1 Volume:6 Page:451-458
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Liyanage Luckshitha Suriyasena¹,Lee Hangwoo¹,Patil Nishant¹,Park Steve¹,Mitra Subhasish¹,Bao Zhenan¹,Wong Hon-Sum Philip¹

Affiliation:

1. Center for Integrated Systems, Department of Chemical Engineering and Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn203771u

Reference29 articles.

1. Carbon nanotube films for transparent and plastic electronics

2. Wafer-Scale Fabrication of Separated Carbon Nanotube Thin-Film Transistors for Display Applications

3. Highly Bendable, Transparent Thin-Film Transistors That Use Carbon-Nanotube-Based Conductors and Semiconductors with Elastomeric Dielectrics

4. Random networks of carbon nanotubes as an electronic material

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