Characterization of Counterion and Surface Influence on Micelle Formation Using Tapping Mode Atomic Force Microscopy in Air-Reference-Cited by-同舟云学术

Characterization of Counterion and Surface Influence on Micelle Formation Using Tapping Mode Atomic Force Microscopy in Air

Published:2006-10-07 Issue:43 Volume:110 Page:21710-21718
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Chaal Lila¹,Pillier Françoise¹,Saidani Boualem¹,Joiret Suzanne¹,Pailleret Alain¹,Deslouis Claude¹

Affiliation:

1. UPR 15 CNRS Interfaces et Systèmes Electrochimiques, University P. et M. Curie, 4 Place Jussieu, 75252 Paris Cédex 05, France, and Laboratory Electrochimie et Corrosion, Department Génie des Procédés, University A Mira-Béjaia, Algeria

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp061607q

Reference33 articles.

1. New Advisory Board Members

2. Direct Visualization of Surfactant Hemimicelles by Force Microscopy of the Electrical Double Layer

3. Molecular Organization of Surfactants at Solid-Liquid Interfaces

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