Multivariate Analysis Combined with Surface Mass Spectrometry (ToF-SIMS): Enabling Problem Solving and Expanding Application Space in an Industrial Environment
Author:
Affiliation:
1. DuPont Corporate Center for Analytical Sciences, Experimental Station Building 323/103A, 200 Powder Mill Road, Wilmington, Delaware 19803, United States
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/jp505243p
Reference18 articles.
1. ToF-SIMS: Surface Analysis by Mass Spectrometry;Vickerman, J. C., and Briggs, D., Eds.IM Publications and SurfaceSpectra Limited:UK, 2001; p5.
2. Handbook of Surface and Interface Analysis: Methods for Problem-Solving,2nded.Riviere, J. C., and Myhra, S., Eds.CRC Press:USA, 2009; p83.
3. Dead-time correction for time-of-flight secondary-ion mass spectral images: a critical issue in multivariate image analysis
4. TOF-SIMS analysis of interplanetary dust
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