Rapid Limit Tests for Metal Impurities in Pharmaceutical Materials by X-ray Fluorescence Spectroscopy Using Wavelet Transform Filtering
Author:
Affiliation:
1. US Food and Drug Administration, Center for Drug Evaluation and Research, Division of Pharmaceutical Analysis, St. Louis, Missouri 63101, United States
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac1028598
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