Phase Tuning, Thin Film Epitaxy, Interfacial Modeling, and Properties of YSZ-Buffered TiO2 on Si(001) Substrate-Reference-Cited by-同舟云学术

Phase Tuning, Thin Film Epitaxy, Interfacial Modeling, and Properties of YSZ-Buffered TiO2 on Si(001) Substrate

Published:2012-08-08 Issue:9 Volume:12 Page:4535-4544
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Bayati M. R.¹,Gupta P.¹,Molaei R.¹,Narayan R. J.¹²,Narayan J.¹

Affiliation:

1. Department of Materials Science and Engineering, North Carolina State University, EB-1, Raleigh, North Carolina 27695-7906, United States

2. Joint Department of Biomedical Engineering, UNC Chapel Hill and North Carolina State University, EB-3, Raleigh, North Carolina 27695-7115, United States

Publisher

American Chemical Society (ACS)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cg3007124

Reference39 articles.

1. Visible photodecomposition of methylene blue over micro arc oxidized WO3–loaded TiO2 nano-porous layers

2. Effects of annealing temperature and method on structural and optical properties of TiO2 films prepared by RF magnetron sputtering at room temperature

3. Epitaxial growth of titanium oxide thin films on c-cut and α-cut sapphire substrates

4. Effect of Crystal Imperfections on Reactivity and Photoreactivity of TiO2 (Rutile) with Oxygen, Water, and Bacteria

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