A Monte Carlo Model for Studying the Microheterogeneity of Trace Elements in Reference Materials by Means of Synchrotron Microscopic X-ray Fluorescence-Reference-Cited by-同舟云学术

A Monte Carlo Model for Studying the Microheterogeneity of Trace Elements in Reference Materials by Means of Synchrotron Microscopic X-ray Fluorescence

Published:2002-08-22 Issue:19 Volume:74 Page:5017-5026
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Kempenaers Lieven¹,Janssens Koen¹,Vincze Laszlo¹,Vekemans Bart¹,Somogyi Andrea¹,Drakopoulos Michael¹,Simionovici Alexandre¹,Adams Freddy¹

Affiliation:

1. Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium, and European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble, Cedex, France

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac025662g

Reference24 articles.

1. Space and time-resolved laser-induced breakdown spectroscopy using charge-coupled device detection

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