Photothermal Atomic Force Microscopy Coupled with Infrared Spectroscopy (AFM-IR) Analysis of High Extinction Coefficient Materials: A Case Study with Silica and Silicate Glasses-Reference-Cited by-同舟云学术

Photothermal Atomic Force Microscopy Coupled with Infrared Spectroscopy (AFM-IR) Analysis of High Extinction Coefficient Materials: A Case Study with Silica and Silicate Glasses

Published:2022-03-21 Issue:13 Volume:94 Page:5231-5239
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Lin Yen-Ting¹,He Hongtu¹²,Kaya Huseyin³,Liu Hongshen¹,Ngo Dien¹^ORCID,Smith Nicholas J.⁴^ORCID,Banerjee Joy⁴,Borhan Ali¹,Kim Seong H.¹³^ORCID

Affiliation:

1. Department of Chemical Engineering and Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, United States

2. Key Laboratory of Testing Technology for Manufacturing Process, Ministry of Education, Southwest University of Science and Technology, Mianyang, Sichuan 621010, China

3. Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States

4. Science & Technology Division, Corning Incorporated, Corning, New York 14831, United States

Funder

Corning Incorporated Foundation

Basic Energy Sciences

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.1c04398