Laboratory Setup for Scanning-Free Grazing Emission X-ray Fluorescence-Reference-Cited by-同舟云学术

Laboratory Setup for Scanning-Free Grazing Emission X-ray Fluorescence

Published:2017-01-10 Issue:3 Volume:89 Page:1965-1971
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Baumann J.¹²^ORCID,Herzog C.¹,Spanier M.¹,Grötzsch D.¹,Lühl L.¹,Witte K.¹,Jonas A.¹,Günther S.¹,Förste F.¹,Hartmann R.³,Huth M.³,Kalok D.³,Steigenhöfer D.³,Krämer M.⁴,Holz T.⁴,Dietsch R.⁴,Strüder L.³⁵,Kanngießer B.¹,Mantouvalou I.¹

Affiliation:

1. Technical University of Berlin, Institute of Optics and Atomic Physics, Hardenbergstraße 36, D-10587 Berlin, Germany

2. Humboldt University of Berlin, School of Analytical Sciences Adlershof (IRIS-Building), Unter den Linden 6, D-10099 Berlin, Germany

3. PNSensor GmbH, Otto-Hahn-Ring 6, D-81739 München, Germany

4. AXO DRESDEN GmbH, Gasanstaltstraße 8b, D-01237 Dresden, Germany

5. University of Siegen, Department of Physics, Walter-Flex-Straße 3, D-57068 Siegen, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.6b04449

Reference36 articles.

1. Characterization by TEM and ToF-SIMS of the oxide layer formed during anaphoretic paint electrodeposition on Al-alloys

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3. A path towards a better characterisation of silicon thin-film solar cells: depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry

4. Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

5. Reference-free X-ray spectrometry based on metrology using synchrotron radiation

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