Scanning Gel Electrochemical Microscopy for Topography and Electrochemical Imaging-Reference-Cited by-同舟云学术

Scanning Gel Electrochemical Microscopy for Topography and Electrochemical Imaging

Published:2018-07-13 Issue:15 Volume:90 Page:8889-8895
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Liu Liang¹^ORCID,Etienne Mathieu¹^ORCID,Walcarius Alain¹^ORCID

Affiliation:

1. Université de Lorraine, CNRS, Laboratoire de Chimie Physique et Microbiologie pour les Matériaux et l’Environnement (LCPME), UMR 7564, Villers-lès-Nancy 54600, France

Funder

Centre National de la Recherche Scientifique

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.8b01011

Reference50 articles.

1. Bard, A. J.; Mirkin, M. V. Scanning electrochemical microscopy, 2nd ed. CRC Press: U.S.A., 2012; p 670.

2. Scanning electrochemical microscopy - a new technique for the characterization and modification of surfaces

3. The Scanning Ion-Conductance Microscope

4. Scanning electrochemical microscopy. Theory of the feedback mode

5. Facilitated Tip-Positioning and Applications of Non-Electrode Tips in Scanning Electrochemical Microscopy Using a Shear Force Based Constant-Distance Mode

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