Surface Heterogeneity in Amorphous Silica Nanoparticles Evidenced from Tapping AFM–IR Nanospectroscopy
Author:
Affiliation:
1. Institute of Chemical Physics, Paris-Saclay University, 91400Orsay, France
2. IFP Energies Nouvelles, Rond-Point de l’échangeur de Solaize, BP 3, 69360Solaize, France
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.analchem.2c04533
Reference42 articles.
1. AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging
2. Photothermal AFM-IR spectroscopy and imaging: Status, challenges, and trends
3. Nanoscale-resolved chemical identification of thin organic films using infrared near-field spectroscopy and standard Fourier transform infrared references
4. Infrared Imaging and Spectroscopy Beyond the Diffraction Limit
5. Advanced Infrared Nanospectroscopy Using Photothermal Induced Resonance Technique, AFMIR: New Approach Using Tapping Mode
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