Nondestructive Elemental Depth-Profiling Analysis by Muonic X-ray Measurement

Author:

Ninomiya Kazuhiko1,Kubo Michael K.2,Nagatomo Takashi3,Higemoto Wataru4,Ito Takashi U.4,Kawamura Naritoshi3,Strasser Patrick3,Shimomura Koichiro3,Miyake Yasuhiro3,Suzuki Takao5,Kobayashi Yoshio6,Sakamoto Shinichi7,Shinohara Atsushi1,Saito Tsutomu8

Affiliation:

1. Graduate School of Science, Osaka University, Toyonaka, Osaka 560-0043, Japan

2. College of Liberal Arts, International Christian University, Mitaka, Tokyo 181-0015, Japan

3. Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan

4. Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan

5. College of Engineering, Shibaura Institute of Technology, Saitama-shi, Saitama 337-8570, Japan

6. Graduate School of Engineering Science, University of Electro-Communications, Chofu, Tokyo 182-8585, Japan

7. J-PARC Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan

8. National Museum of Japanese History, Sakura, Chiba 285-8502, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

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