Electrochemical Aspects and Structure Characterization of VA-VIA Compound Semiconductor Bi2Te3/Sb2Te3 Superlattice Thin Films via Electrochemical Atomic Layer Epitaxy
Author:
Affiliation:
1. State Key Laboratory of Material Processing and Die & Mould Technology, and Department of Electronic Science & Technology, Huazhong University of Science and Technology, Wuhan 430074, Peopleʼs Republic of China
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la8001064
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