Nascent SEI-Surface Films on Single Crystalline Silicon Investigated by Scanning Electrochemical Microscopy-Reference-Cited by-同舟云学术

Nascent SEI-Surface Films on Single Crystalline Silicon Investigated by Scanning Electrochemical Microscopy

Published:2019-01-22 Issue:2 Volume:2 Page:1388-1392
ISSN:2574-0962
Container-title:ACS Applied Energy Materials
language:en
Short-container-title:ACS Appl. Energy Mater.

Author:

dos Santos Sardinha Eduardo¹,Sternad Michael²^ORCID,R. Wilkening H. Martin²^ORCID,Wittstock Gunther¹^ORCID

Affiliation:

1. Carl von Ossietzky University of Oldenburg, School of Mathematics and Natural Sciences, Institute of Chemistry, D-26111 Oldenburg, Germany

2. Graz University of Technology (NAWI Graz), Christian Doppler Laboratory for Lithium Batteries, Institute for Chemistry and Technology of Materials, A-8010 Graz, Austria

Funder

Bundesministerium f?r Bildung und Forschung

Bundesministerium f?r Wissenschaft, Forschung und Wirtschaft

Minist?rio da Ci?ncia, Tecnologia e Inova??o

?sterreichische Nationalstiftung f?r Forschung, Technologie und Entwicklung

Publisher

American Chemical Society (ACS)

Subject

Electrical and Electronic Engineering,Materials Chemistry,Electrochemistry,Energy Engineering and Power Technology,Chemical Engineering (miscellaneous)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaem.8b01967

Reference32 articles.

1. Building better batteries

2. Energy storage beyond the horizon: Rechargeable lithium batteries

3. Lithium barrier materials for on-chip Si-based microbatteries

4. Filming mechanism of lithium-carbon anodes in organic and inorganic electrolytes

5. Fast Li+ Self-Diffusion in Amorphous Li–Si Electrochemically Prepared from Semiconductor Grade, Monocrystalline Silicon: Insights from Spin-Locking Nuclear Magnetic Relaxometry

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