Preparation of Size-Quantized ZnS Thin Films Using Electrochemical Atomic Layer Epitaxy and Their Photoelectrochemical Properties-Reference-Cited by-同舟云学术

Preparation of Size-Quantized ZnS Thin Films Using Electrochemical Atomic Layer Epitaxy and Their Photoelectrochemical Properties

Published:2000-05-26 Issue:13 Volume:16 Page:5820-5824
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Torimoto Tsukasa¹,Obayashi Atsushi¹,Kuwabata Susumu¹,Yasuda Hidehiro¹,Mori Hirotaro¹,Yoneyama Hiroshi¹

Affiliation:

1. Department of Materials Chemistry, Graduate School of Engineering, Osaka University, Yamada-oka 2-1, Suita Osaka 565-0871, Japan, and Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Yamada-oka 2-1, Suita Osaka 565-0871, Japan

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la000133y

Reference50 articles.

1. Epitaxial electrodeposition of cadmium selenide nanocrystals on gold

2. Size-Quantized Nanocrystalline Semiconductor Films

3. Quantum size effects in the study of chemical solution deposition mechanisms of semiconductor films

4. Quantum Size Effects in Chemically Deposited, Nanocrystalline Lead Selenide Films

5. Size Quantization in Electrodeposited CdTe Nanocrystalline Films

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