Using the Adhesive Interaction between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples-Reference-Cited by-同舟云学术

Using the Adhesive Interaction between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples

Published:2004-06-03 Issue:14 Volume:20 Page:5837-5845
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Sun Yujie¹,Akhremitchev Boris¹,Walker Gilbert C.¹

Affiliation:

1. Department of Chemistry, University of Pittsburgh, Pittsburgh, Pennsylvania 15260, and Department of Chemistry, Duke University, Durham, North Carolina 27708

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la036461q

Reference58 articles.

1. Atomic force acoustic microscopy methods to determine thin-film elastic properties

2. Measurement of the elastic modulus of nanostructured gold and platinum thin films

3. Measuring elasticity of biological materials by atomic force microscopy

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