Environmental Scanning Electron Microscopy Study of the Fine Structure of the Triple Line and Cassie−Wenzel Wetting Transition for Sessile Drops Deposited on Rough Polymer Substrates-Reference-Cited by-同舟云学术

Environmental Scanning Electron Microscopy Study of the Fine Structure of the Triple Line and Cassie−Wenzel Wetting Transition for Sessile Drops Deposited on Rough Polymer Substrates

Published:2007-03-17 Issue:8 Volume:23 Page:4378-4382
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Bormashenko Edward¹,Bormashenko Yelena¹,Stein Tamir¹,Whyman Gene¹,Pogreb Roman¹,Barkay Zahava²

Affiliation:

1. The College of Judea and Samaria, The Research Institute, 44837 Ariel, Israel

2. Wolfson Applied Materials Research Center, Tel Aviv University, Ramat-Aviv 69978, Israel

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la0634802

Reference31 articles.

1. Pattern formation in drying drops

2. Contact line deposits in an evaporating drop

3. Capillary flow as the cause of ring stains from dried liquid drops

4. Potential flow inside an evaporating cylindrical line

5. Piling-to-buckling transition in the drying process of polymer solution drop on substrate having a large contact angle

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