Modified Structure Zone Model to Describe the Morphological Evolution of ZnO Thin Films Deposited by Reactive Sputtering-Reference-Cited by-同舟云学术

Modified Structure Zone Model to Describe the Morphological Evolution of ZnO Thin Films Deposited by Reactive Sputtering

Published:2003-09-10 Issue:1 Volume:4 Page:157-159
ISSN:1528-7483
Container-title:Crystal Growth & Design
language:en
Short-container-title:Crystal Growth & Design

Author:

Mirica Eugenia¹,Kowach Glen¹,Du Henry¹

Affiliation:

1. Department of Chemical, Biochemical and Materials Engineering, Stevens Institute of Technology, Hoboken, New Jersey 07030, and Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974

Publisher

American Chemical Society (ACS)

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cg025596b

Reference10 articles.

1. The microstructure of sputter‐deposited coatings

2. Revised structure zone model for thin film physical structure

3. The development of grain structure during growth of metallic films

4. Fundamental structure forming phenomena of polycrystalline films and the structure zone models

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