Accurate Determination of the Index of Refraction of Polymer Blend Films by Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

Accurate Determination of the Index of Refraction of Polymer Blend Films by Spectroscopic Ellipsometry

Published:2010-08-13 Issue:35 Volume:114 Page:15094-15101
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Ng Annie¹,Li Chi Ho¹,Fung Man Kin¹,Djurišić Aleksandra B.¹,Zapien J. A.¹,Chan Wai Kin¹,Cheung Kai Yin¹,Wong Wai-Yeung¹

Affiliation:

1. Department of Physics, Department of Chemistry, The University of Hong Kong, Pokfulam Road, Hong Kong, Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon Tong, Hong Kong, and Department of Chemistry and Centre for Advanced Luminescence Materials, Hong Kong Baptist University, Waterloo Road, Kowloon Tong, Hong Kong

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp104398f

Reference46 articles.

1. Accurate Measurement and Characterization of Organic Solar Cells

2. High throughput testing platform for organic Solar Cells

3. Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films

4. Spectroscopic ellipsometry characterization of polymer–fullerene blend films

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