A Time-Domain Perspective on the Structural and Electronic Response in Epitaxial Ferroelectric Thin Films on Silicon-Reference-Cited by-同舟云学术

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A Time-Domain Perspective on the Structural and Electronic Response in Epitaxial Ferroelectric Thin Films on Silicon

Published:2024-07-23 Issue:31 Volume:24 Page:9429-9434
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Kwamen Christelle¹,Rössle Matthias¹,Leitenberger Wolfram²,Rojo Romeo Pedro³,Vilquin Bertrand³,Dubourdieu Catherine⁴⁵,Bargheer Matias¹²^ORCID

Affiliation:

1. Helmholtz-Zentrum Berlin für Materialien und Energie, Wilhelm-Conrad-Röntgen Campus, BESSY II, Albert-Einstein-Str. 15, 12489 Berlin, Germany

2. Institut für Physik and Astronomie, Universität Potsdam, Karl-Liebknecht-Str. 24-25, 14476 Potsdam, Germany

3. Université de Lyon, Institut des Nanotechnologies de Lyon (UMR5270/CNRS), Ecole Centrale de Lyon, 36 Avenue Guy de Collongue, 69134, Ecully Cedex, France

4. Helmholtz-Zentrum Berlin für Materialien und Energie, Institute Functional Oxides for Energy Efficient Information Technology (IFOX), Hahn-Meitner-Platz 1, 14109 Berlin, Germany

5. Freie Universität Berlin, Physical and Theoretical Chemistry, Arnimallee 22, 14195 Berlin, Germany

Funder

Agence Nationale de la Recherche

Bundesministerium f?r Bildung und Forschung

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.4c00712

Reference59 articles.

1. Physics of thin-film ferroelectric oxides

2. Ferroelectric thin films: Review of materials, properties, and applications

3. Thin-film ferroelectric materials and their applications

4. Ferroelectrics at the nanoscale

5. Ferroelectricity at the nanoscale

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