Recoverable Electrical Breakdown Strength and Dielectric Constant in Ultralow-k Nanolattice Capacitors-Reference-Cited by-同舟云学术

Recoverable Electrical Breakdown Strength and Dielectric Constant in Ultralow-k Nanolattice Capacitors

Published:2019-07-12 Issue:8 Volume:19 Page:5689-5696
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Kim Min-Woo¹,Lifson Max L.²,Rebecca Gallivan A.²,Greer Julia R.²,Kim Bong-Joong¹^ORCID

Affiliation:

1. School of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Korea

2. Division of Engineering and Applied Science, California Institute of Technology, Pasadena, California 91125, United States

Funder

Gwangju Institute of Science and Technology

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b02282

Reference41 articles.

1. CMOS

2. LTCC glass-ceramic composites for microwave application

3. Low temperature sintering and characteristics of K2O–B2O3–SiO2–Al2O3 glass/ceramic composites for LTCC applications

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