Single Electron Precision in the Measurement of Charge Distributions on Electrically Biased Graphene Nanotips Using Electron Holography-Reference-Cited by-同舟云学术

Single Electron Precision in the Measurement of Charge Distributions on Electrically Biased Graphene Nanotips Using Electron Holography

Published:2019-05-22 Issue:6 Volume:19 Page:4091-4096
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Vicarelli Leonardo¹,Migunov Vadim²³^ORCID,Malladi Sairam K.¹,Zandbergen Henny W.¹,Dunin-Borkowski Rafal E.²

Affiliation:

1. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

2. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

3. Central Facility for Electron Microscopy, RWTH Aachen University, Ahornstraße 55, 52074 Aachen, Germany

Funder

Deutsche Forschungsgemeinschaft

Horizon 2020 Framework Programme

H2020 European Research Council

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b01487

Reference44 articles.

1. Graphene-Based Ultracapacitors

2. Rapid Sequencing of Individual DNA Molecules in Graphene Nanogaps

3. Graphene nanodevices for DNA sequencing

4. Room-Temperature Gating of Molecular Junctions Using Few-Layer Graphene Nanogap Electrodes

5. Graphene-based plasmonic tweezers

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