Ultralow Dissipation Patterned Silicon Nanowire Arrays for Scanning Probe Microscopy-Reference-Cited by-同舟云学术

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Ultralow Dissipation Patterned Silicon Nanowire Arrays for Scanning Probe Microscopy

Published:2019-11-25 Issue:1 Volume:20 Page:218-223
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Sahafi Pardis¹²^ORCID,Rose William³,Jordan Andrew¹²,Yager Ben¹²,Piscitelli Michèle¹²,Budakian Raffi¹²⁴

Affiliation:

1. Department of Physics, University of Waterloo, Waterloo, ON N2L3G1, Canada

2. Institute for Quantum Computing, University of Waterloo, Waterloo, ON N2L3G1, Canada

3. Department of Physics, University of Illinois at Urbana—Champaign, Urbana, Illinois 61801, United States

4. Canadian Institute for Advanced Research, Toronto, ON M5G1Z8, Canada

Funder

Army Research Office

Canada First Research Excellence Fund

Natural Sciences and Engineering Research Council of Canada

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b03668

Reference46 articles.

1. Atomic Force Microscope

2. Exploring the nanoworld with atomic force microscopy

3. Electrostatic force microscopy: principles and some applications to semiconductors

4. Nakamura, M.; Yamada, H. In Roadmap of Scanning Probe Microscopy; Morita, S., Ed. Springer: Berlin, 2007; pp 43–51.

5. Magnetic force microscopy: General principles and application to longitudinal recording media

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