Controllable Thickness Inhomogeneity and Berry Curvature Engineering of Anomalous Hall Effect in SrRuO3 Ultrathin Films-Reference-Cited by-同舟云学术

Controllable Thickness Inhomogeneity and Berry Curvature Engineering of Anomalous Hall Effect in SrRuO3 Ultrathin Films

Published:2020-03-23 Issue:4 Volume:20 Page:2468-2477
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Wang Lingfei¹²^ORCID,Feng Qiyuan³,Lee Han Gyeol¹²,Ko Eun Kyo¹²,Lu Qingyou³⁴^ORCID,Noh Tae Won¹²^ORCID

Affiliation:

1. Center for Correlated Electron Systems (CCES), Institute for Basic Science (IBS), Seoul 08826, Republic of Korea

2. Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea

3. Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory and High Magnetic Field Laboratory of Anhui Province, Chinese Academy of Sciences, Hefei, Anhui 230031, China

4. Hefei National Laboratory for Physical Sciences at the Microscale and Anhui Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei, Anhui 230026, China

Funder

Ministry of Science and Technology of the People's Republic of China

Institute for Basic Science

National Natural Science Foundation of China

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.9b05206

Reference49 articles.

2. Recent progress on correlated electron systems with strong spin–orbit coupling