Photoabsorption Imaging at Nanometer Scales Using Secondary Electron Analysis-Reference-Cited by-同舟云学术

Photoabsorption Imaging at Nanometer Scales Using Secondary Electron Analysis

Author:

Zhang Ze¹^ORCID,Martis Joel¹,Xu Xintong¹,Li Hao-Kun¹,Xie Chenlu¹,Takasuka Brad²,Lee Jonghoon³,Roy Ajit K.³,Majumdar Arun¹⁴⁵^ORCID

Affiliation:

1. Department of Mechanical Engineering, Stanford University, Stanford, California 94305, United States

2. Silicon Valley Peripherals Inc., San Jose, California 95117, United States

3. Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, WPAFB, Ohio 45433, United States

4. Department of Photon Science, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States

5. Precourt Institute for Energy, Stanford University, Stanford, California 94305, United States

Funder

Basic Energy Sciences

Air Force Office of Scientific Research

Stanford Precourt Institute for Energy

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference56 articles.

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5. Quantum Materials Manufacturing;Advanced Materials;2022-02-23