He-Ion Microscopy as a High-Resolution Probe for Complex Quantum Heterostructures in Core

He-Ion Microscopy as a High-Resolution Probe for Complex Quantum Heterostructures in Core–Shell Nanowires

Published:2018-05-21 Issue:6 Volume:18 Page:3911-3919
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Pöpsel Christian¹,Becker Jonathan¹,Jeon Nari²,Döblinger Markus³,Stettner Thomas¹^ORCID,Gottschalk Yeanitza Trujillo¹,Loitsch Bernhard¹,Matich Sonja¹,Altzschner Marcus¹,Holleitner Alexander W.¹^ORCID,Finley Jonathan J.¹,Lauhon Lincoln J.²^ORCID,Koblmüller Gregor¹^ORCID

Affiliation:

1. Walter Schottky Institut, Physik Department, and Center for Nanotechnology and Nanomaterials, Technische Universität München, Am Coulombwall 4, Garching, 85748, Germany

2. Department of Materials Science & Engineering, Northwestern University, Evanston, Illinois 60208, United States

3. Department of Chemistry, Ludwig-Maximilian-Universität München, Butenandtstraße 5-13, München, 81377, Germany

Funder

Technische Universit?t M?nchen

Deutsche Forschungsgemeinschaft

Air Force Office of Scientific Research

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.8b01282

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