Retrieving the Quantitative Chemical Information at Nanoscale from Scanning Electron Microscope Energy Dispersive X-ray Measurements by Machine Learning-Reference-Cited by-同舟云学术

Retrieving the Quantitative Chemical Information at Nanoscale from Scanning Electron Microscope Energy Dispersive X-ray Measurements by Machine Learning

Published:2017-10-18 Issue:11 Volume:17 Page:6520-6525
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Jany B. R.¹^ORCID,Janas A.¹,Krok F.¹

Affiliation:

1. Marian Smoluchowski Institute of Physics, Jagiellonian University, Lojasiewicza 11, 30-348 Krakow, Poland

Funder

Ministerstwo Nauki i Szkolnictwa Wyzszego

Narodowe Centrum Nauki

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.7b01789

Reference30 articles.

1. Scanning Microscopy for Nanotechnology

2. Scanning Electron Microscopy and X-ray Microanalysis

3. Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning

4. Blind separation of sources, part I: An adaptive algorithm based on neuromimetic architecture

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