Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles-Reference-Cited by-同舟云学术

Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles

Author:

Rigutti L.¹^ORCID,Venturi L.¹,Houard J.¹,Normand A.¹,Silaeva E. P.¹,Borz M.¹,Malykhin S. A.²³,Obraztsov A. N.²³,Vella A.¹

Affiliation:

1. Groupe de Physique des Matériaux, Normandie Univ, UNIROUEN, INSA Rouen, CNRS, 76000 Rouen, France

2. Department of Physics and Mathematics, University of Eastern Finland, Joensuu 80101, Finland

3. Department of Physics, M V Lomonosov Moscow State University, Moscow 119991, Russia

Funder

Agence Nationale de la Recherche

Association Instituts Carnot

Centre National de la Recherche Scientifique

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference56 articles.

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