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Low-Frequency Interlayer Raman Modes to Probe Interface of Twisted Bilayer MoS2

  • Published:2016-01-26 Issue:2 Volume:16 Page:1435-1444
  • ISSN:1530-6984
  • Container-title:Nano Letters
  • language:en
  • Short-container-title:Nano Lett.

Author:

Huang Shengxi1,Liang Liangbo2,Ling Xi1,Puretzky Alexander A.,Geohegan David B.,Sumpter Bobby G.,Kong Jing1,Meunier Vincent2,Dresselhaus Mildred S.13

Affiliation:

1. Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

2. Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180, United States

3. Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

Funder

New York State Foundation for Science, Technology and Innovation

Oak Ridge National Laboratory

Office of Naval Research

Office of Science

U.S. Department of Energy

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

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