Vertical Conductivity and Topography in Electrostrictive Germanium Sulfide Microribbon via Conductive Atomic Force Microscopy

Author:

Chen Zhangfu1,Hoang Anh Tuan2ORCID,Hwang Woohyun1,Seo Dongjea3,Cho Minhyun4,Kim Young Duck4ORCID,Yang Lianqiao5,Soon Aloysius1ORCID,Ahn Jong-Hyun2ORCID,Choi Heon-Jin1ORCID

Affiliation:

1. Department of Materials Science and Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea

2. School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea

3. Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, United States

4. Department of Physics, Kyung Hee University, Seoul 02447, Republic of Korea

5. Key Laboratory of Advanced Display and System Applications Ministry of Education, Shanghai University, Yanchang Road 149, Shanghai 200072, China

Funder

Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education

Korean Institute of Science and Technology Information (KISTI) supercomputing center through the strategic support program for supercomputing application research

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

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