Uncovering Topological Edge States in Twisted Bilayer Graphene-Reference-Cited by-同舟云学术

Uncovering Topological Edge States in Twisted Bilayer Graphene

Published:2022-07-28 Issue:15 Volume:22 Page:6186-6193
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Fortin-Deschênes Matthieu¹,Pu Rui²,Zhou Yan-Feng³,Ma Chao¹^ORCID,Cheung Patrick³,Watanabe Kenji⁴^ORCID,Taniguchi Takashi⁵^ORCID,Zhang Fan³^ORCID,Du Xu²^ORCID,Xia Fengnian¹^ORCID

Affiliation:

1. Department of Electrical Engineering, Yale University, New Haven, Connecticut 06511, United States

2. Department of Physics and Astronomy, Stony Brook University, Stony Brook, New York 11794, United States

3. Department of Physics, The University of Texas at Dallas, Richardson, Texas 7508, United States

4. Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan

5. International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan

Funder

Army Research Office

Fonds de Recherche du Qu?bec - Nature et Technologies

Japan Society for the Promotion of Science

Natural Sciences and Engineering Research Council of Canada

National Science Foundation

Government of Israel

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.2c01481

Reference50 articles.

1. Electronic effects in scanning tunneling microscopy: Moiré pattern on a graphite surface

2. Moire bands in twisted double-layer graphene

3. van der Waals Heterostructures with High Accuracy Rotational Alignment

4. Tunable moiré bands and strong correlations in small-twist-angle bilayer graphene

5. Reproducibility in the fabrication and physics of moiré materials

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