Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy-Reference-Cited by-同舟云学术

Transient Strain-Induced Electronic Structure Modulation in a Semiconducting Polymer Imaged by Scanning Ultrafast Electron Microscopy

Author:

Kim Taeyong¹,Oh Saejin²,Choudhry Usama¹,Meinhart Carl D.¹^ORCID,Chabinyc Michael L.³^ORCID,Liao Bolin¹^ORCID

Affiliation:

1. Department of Mechanical Engineering, University of California, Santa Barbara, California 93106, United States

2. Department of Chemistry and Biochemistry, University of California, Santa Barbara, California 93106, United States

3. Materials Department, University of California, Santa Barbara, California 93106, United States

Funder

Army Research Office

U.S. Department of Energy

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference54 articles.

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献