Reconstruction of the Near-Field Electric Field by SNOM Measurement-Reference-Cited by-同舟云学术

Reconstruction of the Near-Field Electric Field by SNOM Measurement

Published:2023-10-20 Issue:21 Volume:23 Page:9900-9906
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Fan Yihang¹,Xue Xiaotian¹,Yang Fei¹,Zhao Jianqiao¹,Xiong Xiaoyu²,Sun Jingbo²,Wang Weipeng¹,Shi Ji³^ORCID,Zhou Ji²,Zhang Zhengjun¹^ORCID

Affiliation:

1. Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 10084, People’s Republic of China

2. State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084, People’s Republic of China

3. School of Materials and Chemical Technology, Tokyo Institute of Technology, Tokyo 1528552, Japan

Funder

Tsinghua University

National Natural Science Foundation of China

Tsinghua-Foshan Innovation Special Fund

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.3c02833

Reference43 articles.

1. Plasmonics: Fundamentals and Applications

2. Surface Plasmons on Smooth and Rough Surfaces and on Gratings

3. Optical Constants of the Noble Metals

4. Notizen: Radiative Decay of Non Radiative Surface Plasmons Excited by Light

5. Efficient Directional Coupling between Silicon and Copper Plasmonic Nanoslot Waveguides: toward Metal−Oxide−Silicon Nanophotonics

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