Metalens for Accelerated Optoelectronic Edge Detection under Ambient Illumination-Reference-Cited by-同舟云学术

Metalens for Accelerated Optoelectronic Edge Detection under Ambient Illumination

Published:2023-12-18 Issue:1 Volume:24 Page:356-361
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Wang Shuai¹²^ORCID,Li Liu¹,Wen Shun¹,Liang Ruiqi¹,Liu Yaxi¹,Zhao Feng¹,Yang Yuanmu¹^ORCID

Affiliation:

1. State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China

2. Qingdao Innovation and Development Center, Harbin Engineering University, Qingdao 26600, China

Funder

China Postdoctoral Science Foundation

National Natural Science Foundation of China

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.3c04112

Reference49 articles.

1. Analogue computing with metamaterials

2. Why future supercomputing requires optics

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4. Meta-optical and thin film devices for all-optical information processing

5. Ultracompact meta-imagers for arbitrary all-optical convolution

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