Author:
Gregory Caroline L.,Nullens Henri A.,Gijbels Renaat H.,Van Espen Pierre J.,Geuens Ingrid,De Keyzer René
Publisher
American Chemical Society (ACS)
Reference33 articles.
1. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry
2. Geuens, I.; Gijbels, R.; Verbeeck, A.; De Keyzer, R.Proceedings ofICPS'94: The Physics and Chemistry of Imaging Systems; Society for Imaging Science and Technology: Springfield, VA, 1994; pp 27−30.
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14 articles.
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