Atomic-Resolution Imaging of the Nanoscale Origin of Toughness in Rare-Earth Doped SiC-Reference-Cited by-同舟云学术

Atomic-Resolution Imaging of the Nanoscale Origin of Toughness in Rare-Earth Doped SiC

Published:2008-08-15 Issue:9 Volume:8 Page:2935-2939
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Kueck Aaron M.¹,Kim Do Kyung¹,Ramasse Quentin M.¹,De Jonghe L. C.¹,Ritchie R. O.¹

Affiliation:

1. Materials Sciences Division, and National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, and Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl8017884

Reference32 articles.

1. Controlling Cracks in Ceramics

2. Crack Arrest and Multiple Cracking in Glass Through the Use of Designed Residual Stress Profiles

3. Making metallic glasses plastic by control of residual stress

4. Laminar Ceramics That Exhibit a Threshold Strength

5. Single-wall carbon nanotubes as attractive toughening agents in alumina-based nanocomposites

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