Kinetics of Atomic Force Microscope-Based Scanned Probe Oxidation on an Octadecylated Silicon(111) Surface
Author:
Affiliation:
1. State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry and Graduate School of Chinese Academy of Sciences, Chinese Academy of Sciences, Changchun 130022, People's Republic of China
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp0553030
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1. Nanolithography and Nanochemistry: Probe-Related Patterning Techniques and Chemical Modification for Nanometer-Sized Devices
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4. Characterization of scanning tunneling microscopy and atomic force microscopy-based techniques for nanolithography on hydrogen-passivated silicon
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