Clustered DNA Damage Induced by 2–20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell Death-Reference-Cited by-同舟云学术

Clustered DNA Damage Induced by 2–20 eV Electrons and Transient Anions: General Mechanism and Correlation to Cell Death

Published:2019-05-17 Issue:11 Volume:10 Page:2985-2990
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Dong Yanfang¹,Gao Yingxia¹,Liu Wenhui¹,Gao Ting¹,Zheng Yi¹^ORCID,Sanche Léon²

Affiliation:

1. State Key Laboratory of Photocatalysis on Energy and Environment, Faculty of Chemistry, Fuzhou University, Fuzhou 350116, P. R. China

2. Department of Nuclear Medicine and Radiobiology and Clinical Research Center, Faculty of Medicine, Université de Sherbrooke, Sherbrooke, QC, Canada J1H 5N4

Funder

Canadian Institutes of Health Research

National Natural Science Foundation of China

State Key Laboratory of Photocatalysis on Energy and Environment, Fuzhou University

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.9b01063

Reference66 articles.

1. Production of low-energy electrons by ionizing radiation

2. Precursors of Solvated Electrons in Radiobiological Physics and Chemistry

3. Biomolecular Action of Ionizing Radiation

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