Strong Hole Trapping Due to Oxygen Dimers in BiVO4: Effect on the Water Oxidation Reaction-Reference-Cited by-同舟云学术

Strong Hole Trapping Due to Oxygen Dimers in BiVO4: Effect on the Water Oxidation Reaction

Published:2019-10-28 Issue:22 Volume:10 Page:7113-7118
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Ambrosio Francesco¹²^ORCID,Wiktor Julia³^ORCID

Affiliation:

1. Computational Laboratory for Hybrid/Organic Photovoltaics (CLHYO), Istituto CNR di Scienze e Tecnologie Molecolari (ISTM-CNR), Via Elce di Sotto 8, 06123 Perugia, Italy

2. CompuNet, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy

3. Department of Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.9b02701

Reference64 articles.

1. Electrochemical Photolysis of Water at a Semiconductor Electrode

2. Photocatalyst releasing hydrogen from water

3. Solar Water Splitting Cells

4. Electronic Structure of Monoclinic BiVO4

5. Indirect Bandgap and Optical Properties of Monoclinic Bismuth Vanadate

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