Energy Absorption and Beam Damage during Microfocus Synchrotron X-ray Diffraction-Reference-Cited by-同舟云学术

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Energy Absorption and Beam Damage during Microfocus Synchrotron X-ray Diffraction

Published:2024-06-07 Issue:24 Volume:15 Page:6286-6291
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Stanko Štefan T.¹^ORCID,Schawe Jürgen E. K.¹²^ORCID,Spieckermann Florian³^ORCID,Eckert Jürgen³⁴,Löffler Jörg F.¹^ORCID

Affiliation:

1. Laboratory of Metal Physics and Technology, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland

2. Mettler-Toledo GmbH, Analytical, 8606 Nänikon, Switzerland

3. Department of Materials Science Chair of Materials Physics, Montanuniversität Leoben, 8700 Leoben, Austria

4. Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, 8700 Leoben, Austria

Funder

Eidgenössische Technische Hochschule Zürich

H2020 Marie Sklodowska-Curie Actions

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.4c00497

Reference46 articles.

1. Review of third and next generation synchrotron light sources

2. ESRF: Inside the Extremely Brilliant Source Upgrade

3. X-ray source gets a 100-fold boost in brightness

4. Non-invasive measurement of X-ray beam heating on a surrogate crystal sample

5. High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

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